Crystallography I

This lecture, delivered entirely in English, provides a basic introduction to crystallography and electron diffraction for beginners. X-ray diffraction is an important characterization technique in modern chemistry; the majority of crystalline structures in inorganic and organic solids have been determined using this method. It is therefore important for all students to understand its basic concepts and instrumentation. The course explains the principles of X-ray diffraction, along with the geometry and symmetry of X-ray patterns. In addition to the principles of interaction between X-rays and matter, it covers how to obtain quantitative intensities for single-crystal and powder diffraction patterns. It naturally includes an understanding of lattice planes and the concept of the reciprocal lattice, along with the construction of the Ewald sphere. Furthermore, it provides a basic understanding of the Fourier transform relationship between the crystalline structure and the diffracted intensities, as well as the concept of the reciprocal lattice.

Electron diffraction is a technique that complements X-ray diffraction and provides information on the symmetry and geometry of the materials under study. In this course, we will therefore explore the methods for obtaining electron diffraction patterns and interpreting them. We will be able to determine the lattice parameters, the reflection conditions, and the possible space groups.

This lecture also serves as an introduction to the lecture "Electron Microscopy and Crystallography II"

CM: 14

TD: 6

• Interpretation of X-ray diffraction patterns: lattice parameters and intensity calculation
• Gaining a Basic Understanding of X-Ray Diffractometers
• Gaining a Basic Understanding of the Electron Microscope
• To understand the mechanisms by which X-rays and electrons interact with matter
• Interpretation of Electron Diffraction Patterns: Microstructural Effects, Lattice Parameters, Reflection Conditions, Possible Space Groups.

None

Bachelor's degree in Materials Science, Chemistry, or Physics

Ongoing Assessment

basic inorganic structures, geometry and symmetry, Bravais lattices, X-ray generation, structure factor, form factor, intensities, powder and single-crystal diffraction, X-ray diffractometer, reciprocal lattice, Ewald sphere, electron diffraction, diffraction pattern

References:

• Transmission Electron Microscopy: A Textbook for Materials Science, by Davis B. Williams and C. Barry Carter
• Physical Principles of Electron Microscopy, Ray F. Egerton, Springer
• and C. McKie: *Essentials of Crystallography*, Blackwell Scientific Publications
• Borchardt-Ott: *Crystallography: An Introduction*, Springer
• Als-Nielsen, D. McMorrow: *Elements of Modern X-ray Physics*

Administrative contact(s): Chemistry Master's Program Office Master's in Chemistry @ umontpellier.fr