Study level
BAC +5
ECTS
5 credits
Component
Faculty of Science
Hourly volume
33h
Description
The aim of this module is to teach the operating principles of the main techniques for characterizing the structure (volume and surface) and properties (optical, electronic, etc.) of condensed matter:
- X-ray and electron diffraction techniques
- optical spectroscopy techniques (absorption, reflection, luminescence)
- local probe microscopy
The aim of this module is to teach the operating principles of the main techniques for characterizing the structure (volume and surface) and properties (optical, electronic, etc.) of condensed matter:
- X-ray and electron diffraction techniques
- optical spectroscopy techniques (absorption, reflection, luminescence)
- local probe microscopy
Objectives
- review the physical phenomena underlying these different techniques
- train students to be informed users of these techniques
Necessary prerequisites
- Material organization
- Wave physics
- Atoms, Molecules and Radiation
- Condensed matter physics: structural properties, electronic properties
Recommended prerequisites:
- Quantum mechanics
- Introduction to nanoscience and nanotechnology
Knowledge control
CCI
Syllabus
X-ray and electron diffraction
Optical spectroscopy: Maxwell's equations; propagation of an electromagnetic wave in a material medium; complex dielectric permittivity; radiation absorption; Fresnel coefficients and reflectivity; ellipsometry; luminescence; radiative and non-radiative relaxation and recombination phenomena; excitation of photoluminescence; radiative and non-radiative lifetime measurements.
Local probe microscopy: operating principles of SPM: AFM, STM, etc.; atomic, molecular and particle interactions, contact mechanics, vibrational response of a lever, tunneling, electronic states.