ECTS
5 credits
Training structure
Faculty of Science
Description
- Testing digital integrated circuits.
- Examples of mistakes.
- Generation of test vectors.
- Design for test (DFT).
- Built-in self-test (BIST).
- Analog Integrated Circuit Testing.
- Industrial testing (functional and parametric testing, characterization).
Objectives
Understand the issues involved in industrial testing of integrated circuits and systems, as well as methods for reducing testing costs (vector generation, test-oriented design, etc.). Understand characterization techniques and know how to determine the operating and performance margins of digital integrated circuits.
Mandatory prerequisites
Knowledge of analog and digital electronics
Syllabus
Essentials of Electronic Testing, M.L. Bushnell and V.D. Agrawal, Kluwer Academic Publishers
Additional information
CM: 9 p.m.
Practical work: 9 p.m.