Testing and Reliability of Integrated Circuits and Systems

• Digital integrated circuit testing.
• Fault patterns.
• Generation of test vectors.
• Design for Testing (DFT).
• Standalone Integrated Testing (BIST).
• Testing of Analog Integrated Circuits.
• Industrial testing (functional and parametric tests, characterization).

Understand the problems associated with the industrial testing of integrated circuits and systems, as well as methods for reducing test costs (vector generation, design for test, etc.). Understand characterization techniques and know how to determine the operating and performance margins of digital integrated circuits.

Knowledge of analog and digital electronics

Essentials of Electronic Testing, M.L. Bushnell and V.D. Agrawal, Kluwer Academic Publishers

CM: 21h

Practical work: 21h