• ECTS

    5 credits

  • Training structure

    Faculty of Science

Description

  • Testing digital integrated circuits.
  • Examples of mistakes.
  • Generation of test vectors.
  • Design for test (DFT).
  • Built-in self-test (BIST).
  • Analog Integrated Circuit Testing.
  • Industrial testing (functional and parametric testing, characterization).

 

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Objectives

Understand the issues involved in industrial testing of integrated circuits and systems, as well as methods for reducing testing costs (vector generation, test-oriented design, etc.). Understand characterization techniques and know how to determine the operating and performance margins of digital integrated circuits.

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Mandatory prerequisites

Knowledge of analog and digital electronics

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Syllabus

Essentials of Electronic Testing, M.L. Bushnell and V.D. Agrawal, Kluwer Academic Publishers

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Additional information

CM: 9 p.m.

Practical work: 9 p.m.

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