• ECTS

    5 credits

  • Component

    Faculty of Science

Description

  • Testing of digital integrated circuits.
  • Mistake models.
  • Generation of test vectors.
  • Design for Test (DFT).
  • Stand-alone integrated test (BIST).
  • Testing of Analog Integrated Circuits.
  • Industrial testing (functional and parametric tests, characterization).

 

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Objectives

Understand the problems related to the industrial testing of integrated circuits and systems as well as the methods to reduce the costs of this test (vector generation, design for test, ...). Understand characterization techniques and know how to determine the operating and performance margins of digital integrated circuits

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Necessary pre-requisites

Knowledge of analog and digital electronics

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Syllabus

Essentials of Electronic Testing, M.L. Bushnell and V.D. Agrawal, Kluwer Academic Publishers

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Additional information

CM : 21h

TP : 21h

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