Testing and Reliability of Integrated Circuits and Systems

• Testing of digital integrated circuits.
• Types of errors.
• Generation of test vectors.
• Design for Test (DFT).
• Self-Contained Built-In Test (BIST).
• Testing Analog Integrated Circuits.
• Industrial testing (functional and parametric tests, characterization).

Understand the issues related to the industrial testing of integrated circuits and systems, as well as methods for reducing the costs of such testing (vector generation, design for test, etc.). Understand characterization techniques and know how to determine the operating and performance margins of digital integrated circuits

Knowledge of analog and digital electronics

Essentials of Electronic Testing, by M.L. Bushnell and V.D. Agrawal, Kluwer Academic Publishers

CM: 9:00 p.m.

TP: 9:00 p.m.