Crystallography II and Electron Microscopy

The structural characterization of materials is a mandatory prerequisite for developing functional materials and an absolute necessity for materials science researchers and engineers. To interpret diffraction patterns, structures, microstructures, and so on, a detailed understanding of crystallography, structural analysis, and the instruments used is essential. This knowledge is built from the ground up, gradually leading to an understanding of how to characterize materials using both standard and sophisticated diffraction methods. The course also includes laboratory work on powder and single-crystal diffractometers, enabling students to acquire the skills needed to correctly use and interpret diffraction data. The^{first-semester} portion of the course focuses primarily on X-ray diffraction and electron microscopy, while the crystallography component continues in the^second semester with topics such as symmetry, structure determination, and structure refinement, as well as neutron scattering and magnetic structure analysis.

This lecture consists of two parts:

(1): Crystallography: Simple inorganic structures: basics & concepts, Fractional atomic coordinates and projections, Bravais lattices, Crystal systems, Lattice points, lines, and planes, Miller indices, Zone equation, Wulff net, orienting matrix, Crystal growth and morphology, X-ray sources, interaction of X-rays, electrons, and neutrons with matter, scattering lengths, structure factor, systematic extinctions, Debye-Waller factor, principles of scattering, reciprocal lattice, concept of the Ewald sphere, Laue diffraction, Debye-Scherrer camera, powder diffractometers, single-crystal diffractometers, monochromators, detectors, resolution, stereographic projection, peak intensities, reflection profile broadening, and grain size,

(2): Electron microscopy:

In this section, we will focus on electron microscopy through flipped classroom sessions. We will discuss the following topics: electron sources, lenses and aberrations, sample preparation, electron diffraction, structural and chemical analysis, and imaging techniques.

Hourly volumes*:

CM: 34

TD: 18

An introduction to basic crystal chemistry and the structural characterization of condensed matter using diffraction methods.

The objectives of the transmission electron microscopy section are to provide a solid foundation in electron microscopy so that students can apply appropriate methods for characterizing materials. The expected skills for this section include a detailed understanding of the principles of an electron microscope (scanning and transmission modes) and the ability to describe and schematically represent the instrument and its specific features.

Students will become familiar with diffraction methods and will be able to interpret X-ray powder and single-crystal diffraction patterns, which are analyzed both manually and using state-of-the-art software.

The flipped classroom approach promotes student engagement and active participation. This method of learning helps students master the material and share it with the class.

Full CC

Crystallography:

Simple inorganic structures: basics & concepts, Fractional atomic coordinates and projections, Bravais lattices, Crystal systems, Lattice points, lines, and planes, Miller indices, Zone equation, Wulff net, orienting matrix, Crystal growth and morphology, X-ray sources, interaction of X-rays, electrons, and neutrons with matter, scattering lengths, structure factor, systematic extinctions, Debye-Waller factor, principles of scattering, reciprocal lattice, concept of the Ewald sphere, Laue diffraction, Debye-Scherrer camera, powder diffractometers, single-crystal diffractometers, monochromators, detectors, resolution, stereographic projection, peak intensities, reflection profile broadening, and grain size,

Electron microscopy:

In this section, we will focus on electron microscopy through flipped classroom sessions. We will discuss the following topics: electron sources, lenses and aberrations, sample preparation, electron diffraction, structural and chemical analysis, and imaging techniques.

Administrative contact(s):

Master's in Chemistry Office Master's in Chemistry @ umontpellier.fr

• Transmission Electron Microscopy: A Textbook for Materials Science, by Davis B. Williams and C. Barry Carter
• Physical Principles of Electron Microscopy, Ray F. Egerton, Springer
• and C. McKie: *Essentials of Crystallography*, Blackwell Scientific Publications
• Borchardt-Ott: *Crystallography: An Introduction*, Springer
• Als-Nielsen, D. McMorrow: *Elements of Modern X-ray Physics*