Crystallography II and Electron Microscopy

The structural characterization of materials is a mandatory prerequisite for developing functional materials and an absolute must for materials science researchers and engineers. For the interpretation of diffraction patterns, structures, microstructures, etc., detailed knowledge of crystallography, structure analysis, and the instruments used is necessary. The necessary knowledge is developed from scratch, progressively yielding an understanding of how to characterize materials by standard and sophisticated diffraction methods. The lecture also includes lab work on powder and single crystal diffractometers, allowing students to acquire the skills to correctly use and interpret diffraction data. The lecture during the^first semester essentially covers X-ray diffraction and electron microscopy, while the crystallography part continues during the^second semester with symmetry, structure solution, and structure refinements, as well as neutron scattering and magnetic structure analysis.

This lecture consists of two parts:

(1): Crystallography: Simple inorganic structures: basics & concepts, Fractional atomic coordinates and projections, Bravais lattices, Crystal systems, Lattice points, lines and planes, Miller indices, Zone equation, Wulff net, orienting matrix, Crystal growth and morphology, X-ray sources, interaction of X-rays, electrons and neutrons with matter, scattering lengths, structure factor, systematic extinctions, Debye-Waller factor, principles of scattering, reciprocal lattice, concept of Ewald sphere, Laue diffraction, Debye Scherrer camera, powder diffractometers, single crystal diffractometers, monochromators, detectors, resolution, stereographic projection, peak intensities, reflection profile broadening and grain size,

(2): Electron microscopy:

In this part, we will be interested in electron microscopy through flipped classes. We will discuss the following topics: Electron sources, lenses and aberrations, sample preparation, electron diffraction, structural and chemical analysis, imaging techniques.

Hourly volumes:

CM: 34

TD: 18

Introduction to basic crystal chemistry and structural characterization of condensed matter by diffraction methods.

The objectives of the transmission electron microscopy part are to provide solid knowledge in electron microscopy in order to be able to use appropriate methods for the characterization of materials. The expected skills for this part are detailed knowledge of the principles of an electron microscope (scanning and transmitted beam) and the ability to describe and schematize the device and its specificities.

Students will become familiar with diffraction methods and be able to interpret X-ray powder and single crystal diffraction patterns, which are analyzed both manually and using state-of-the-art programs.

The use of the flipped classroom promotes student engagement and investment. This way of working is interesting for acquiring knowledge and passing it on to the class.

Full CC

Crystallography:

Simple inorganic structures: basics & concepts, Fractional atomic coordinates and projections, Bravais lattices, Crystal systems, Lattice points, lines and planes, Miller indices, Zone equation, Wulff net, orienting matrix, Crystal growth and morphology, X-ray sources, interaction of X-rays, electrons and neutrons with matter, scattering lengths, structure factor, systematic extinctions, Debye-Waller factor, principles of scattering, reciprocal lattice, concept of Ewald sphere, Laue diffraction, Debye Scherrer camera, powder diffractometers, single crystal diffractometers, monochromators, detectors, resolution, stereographic projection, peak intensities, reflection profile broadening and grain size,

Electron microscopy:

In this part, we will be interested in electron microscopy through flipped classes. We will discuss the following topics: Electron sources, lenses and aberrations, sample preparation, electron diffraction, structural and chemical analysis, imaging techniques.

Administrative contact(s):

Master's Program in Chemistry Secretariat Master's degree in Chemistry @ umontpellier.fr

• Transmission Electron Microscopy, A Textbook for Materials Science, Davis B. Williams, C. Barry Carter
• Physical Principles of Electron Microscopy, Ray F. Egerton, Springer
• and C. McKie: Essentials of Crystallography, Blackwell Scientific Publications
• Borchardt-Ott: Crystallography: an introduction, Springer
• Als-Nielsen, D. McMorrow: Elements of Modern X-ray Physics