Crystallography I

This lecture, delivered entirely in English, provides a basic introduction to crystallography and electron diffraction for beginners. X-ray diffraction is an important characterization technique in modern chemistry; the majority of crystalline structures in inorganic and organic solids have been solved using this method. It is therefore important for all students to understand its basic concepts and instrumentation. The course provides explanations and principles of X-ray diffraction together with the geometry and symmetry of X-ray patterns. In addition to the interaction principles of X-rays and matter, it covers how to obtain quantitative intensities for single crystal and powder diffraction patterns. It naturally includes an understanding of lattice planes and the reciprocal lattice concept together with the Ewald sphere construction. Furthermore, it provides a basic understanding of the Fourier transform relationship between the crystalline structure and the diffracted intensities, as well as the reciprocal lattice concept.

Electron diffraction is a complementary technique to X-rays that provides information in terms of symmetry and geometry on the materials studied. In this course, we will therefore approach the description of the method for obtaining electron diffraction patterns and their interpretation. We will be able to obtain the lattice parameters, the reflection conditions, as well as the groups of possible spaces.

This lecture also serves as the introductory part to the lecture Electron Microscopy and Crystallography II.

CM: 14

TD: 6

• Interpretation of X-ray diffraction patterns: lattice parameters and intensity calculation
• Getting a basic understanding of X-ray diffractometers
• Getting a basic understanding of Electron Microscope
• To understand the interaction mechanisms of X-rays and electrons with matter
• Interpretation of Electron Diffraction patterns: Microstructural effect, lattice parameters, reflection conditions, possible space groups.

None

Bachelor's degree in Materials Science, Chemistry, or Physics

Continuous assessment

basic inorganic structures, geometry and symmetry, Bravais lattices, X-ray generation, structure factor, form factor, intensities, powder and single crystal diffraction, X-ray diffractometer, reciprocal lattice, Ewald sphere, electron diffraction, diffraction pattern

Literature:

• Transmission Electron Microscopy, A Textbook for Materials Science, Davis B. Williams, C. Barry Carter
• Physical Principles of Electron Microscopy, Ray F. Egerton, Springer
• and C. McKie: Essentials of Crystallography, Blackwell Scientific Publications
• Borchardt-Ott: Crystallography: an introduction, Springer
• Als-Nielsen, D. McMorrow: Elements of Modern X-ray Physics

Administrative contact(s): Master's in Chemistry Secretariat Master's degree in Chemistry @ umontpellier.fr